|Item 26I-M-1031 : REFLECTED LIGHT RESEARCH MICROSCOPE C. ZEISS UNIVERSAL M|
|Large reflected light research microscope. For all microscope techniques from brightfield, darkfield, differential interference contrast to polarizing microscopy|
|Item 26I-M-0169 : REFLECTED LIGHT METALLURGICAL MICROSCOPE OLYMPUS BHMJL|
|The Olympus BHMJL metallurgical microscope features a cross movement stage with 6" x6" scanning area and reflected Iight brightfield/darkfield observation. |
The BHMJ L is the ideal microscope for inspection and quality control of large wafers, photo masks in the IC industry, metallurgical specimen, etc.
|Item 26I-M-0371 : REFLECTED LIGHT BINOCULAR MICROSCOPE LEITZ ERGOLUX|
|The Leitz Ergolux microscope for routine quality control, semiconductor inspection and metallurgical application requiring brightfield, darkfield and polarization.|